dc.contributor.author | Mwanauta, Regina | |
dc.contributor.author | Mtei, Kelvin | |
dc.contributor.author | Ndakidemi, Patrick | |
dc.date.accessioned | 2023-09-12T08:03:37Z | |
dc.date.available | 2023-09-12T08:03:37Z | |
dc.date.issued | 2015-05-22 | |
dc.identifier.uri | http://dx.doi.org/10.4236/as.2015.65048 | |
dc.identifier.uri | https://dspace.nm-aist.ac.tz/handle/20.500.12479/1973 | |
dc.description | This research article was published Scientific Research Publishing in 2015 | en_US |
dc.description.abstract | Common bean production in Africa suffers from different constrains. The main damage is caused
by insect pest infestations in the field. The most common insects pests which attack common bean
in the field are the bean stem maggot (Ophiomyia phaseoli), ootheca (Ootheca bennigseni) and
aphids (Aphis fabae). Currently, few farmers in Africa are using commercial pesticides for the con trol of these insect pests. Due to the negative side effects of commercial pesticides to human health
and the environment, there is a need for developing and recommending alternative methods such
as those involving agronomic and botanical/biological measures in controlling common bean in sect pests. This review aim to report the most common insects pests which attack common bean
(Phaseolus vulgaris L.) in the field and explore the potential of agronomic, biological and botanical
methods as a low-cost, safe and environmentally friendly means of controlling insect pests in le gumes. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Scientific Research Publishing | en_US |
dc.subject | Field Pests | en_US |
dc.subject | Damage | en_US |
dc.subject | Pest Management | en_US |
dc.subject | Plant Extracts | en_US |
dc.subject | Explore | en_US |
dc.subject | Potential | en_US |
dc.title | Potential of Controlling Common Bean Insect Pests (Bean Stem Maggot (Ophiomyia phaseoli), Ootheca (Ootheca bennigseni) and Aphids (Aphis fabae)) Using Agronomic, Biological and Botanical Practices in Field | en_US |
dc.type | Article | en_US |